Detail Environmentally Controlled Atomatic Force Microscope Nanoview AC-AFM
Testing Instrument
1. Integrated design of optical metallographic microscope, and atomic force microscope,,powerfull functions.
2. It has both optical microscope and atomic force microscope imaging functions,both of which can work at the same time without affecting each other.
3.Can work in ordinary air environment,liquid enviroment,temperature control,environment and inert gas control, enviroment at the same time.
4. The sample scanning table and the laser detection head are designed in closed type,and special gas can filled and discharged inside,without adding a sealing cover.
5. the laser detection adopts a vertcal optical path design,an can work under liquid with the gas-liquid dual-purpose probe holder.
6.The single axis drive sample automatically approaches the probe vertically, so that the tip of the needle is scanned perpendicular to the sample.
7. The intelligent needle feeding method of the motor controlled pressurized piezoelectric ceramic automatic detection protecs the probe and the sample.
8.ultra-high magnification optical positioning system to achieve precise positioning of probe and sample scanning area.
9.Integrated scanner non linear correction user editor,nanometer
